1 Sep 2015

Some Extended Weibull Distributions for Reliability Modeling and Analysis

Professor Min Xie, City University of Hong Kong, will be visiting the Mechatronics division at KTH in September. We are very pleased to announce that he will give a one-hour seminar, open to all. See below for an abstract and a short biography.

Time:  Tue 2015-09-22 10.00

Lecturer:  Prof Min Xie, City University of Hong Kong

Location:  Innovation Studio, KTH Department of Machine Design, Brinellvägen 85

Exponential distribution is widely used in the modelling and analysis of time-between-events, particularly in reliability and survival analysis. It is well-known that this distribution implies no-ageing which is not realistic. Weibull distribution has been used for monotonic aging. It is especially suitable for industrial applications because of its graphical interpretation and probability plotting procedure for both parameter estimation and model validation. However, the basic Weibull distribution with two parameters is still not flexible enough, for example in the modelling of well-known bathtub-shaped hazard rate function. Several extended Weibull distributions have been developed and studied. In this talk, we will introduce some of our research studies in this area. Some useful models will be presented and their properties and uses will be discussed. A few related research directions will also be highlighted.

M. Xie received his PhD from Linkoping University, Sweden in 1987. He did his undergraduate study at KTH Royal Institute of Technology in Stockholm and graduated with an MSc in1984. Prior to that, he was a student at University of Science and Technology of China for a year. Dr Xie joined the National University of Singapore in 1991 as one of the first recipients of the prestigious LKY Research Fellowship. In May 2011, Prof Xie moved to City University of Hong Kong as Chair professor of industrial engineering. He was an invited professor to INPG, France, in 2000 and a William Mong Visiting Fellow to Univ of Hong Kong in 1996. Prof Xie has published over 200 journal papers and 8 books, including "Software Reliability Modelling” by World Scientific, "Weibull Models” by John Wiley, "Stochastic Aging and Dependence for Reliability” by Springer, "Advanced QFD Applications” by ASQ Quality Press. He is an editor, associate editor and on the editorial board of many established international journals. Prof Xie is an elected fellow of IEEE. He has supervised nearly 40 PhD students.